The joint use of scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) techniques provides complementary information. SEM enables surface images with a high resolution to be obtained, while XPS provides information on surface chemical composition and bond structure. Combining the two techniques will allow microstructures based on superimposing layers of nanometre thicknesses to be related to their composition, determined after obtaining XPS in-depth composition profiles. It will further be possible to relate alterations of the materials visible at a very superficial level to compositional changes.

In this sense, the Area for Specialised Instrumental Techniques has undertaken studies on the characterisation of functional coatings of nanometre thickness deposited on all types of substrates, and studies have been conducted on the interaction of the materials surface with the surroundings, solids diffusivity phenomena, oxidation of metal surfaces, materials performance on exposure to attack by fluids, etc.

Example: Characterisation of a sol-gel-derived TiO₂ coating.

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